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谷电子学,即对谷自由度的控制和操纵,被认为是未来信息处理的新范式。目前对谷电子学的研究大部分都集中于如何操纵材料的谷赝自旋。谷电子学领域的研究可以追溯到对硅等传统半导体材料的研究,但是这些传统材料利用谷极化的能力有限。近年来,单层过渡金属硫化物(TMD)材料的发现,激发了对谷电子学的广泛研究。例如,人们发现,载流子掺杂可以显著提高单层TMD中的 g 因子,这种增强被归因于多体效应。然而,这还缺乏定量理解。目前,针对这个方向的理论研究存在两个缺点:首先,它们不是基于第一性原理的从头算法,不能提供定量预测;其次,相关研究都集中在硅或 III-V 半导体,这与单层TMD 有很大不同。
来自于新加坡国立大学先进二维材料中心的Su Ying Quek教授,基于多体扰动理论,开发了一种从头计算方法,可以计算载流子掺杂体系中相互作用增强的 g因子。在这个理论框架下,作者发现,掺杂的单层WSe2中的g因子通过屏蔽交换相互作用得到增强,这是由磁场引起的能带占据变化引起的。相互作用增强的 g 因子与实验结果非常吻合。与硅等传统的谷电子材料不同,在标准实验室可实现的临界磁场 Bc 之外,g 因子的增强会消失。他们进一步确定了导致填谷填充不稳定和朗道能级排列的g因子增强范围和相应的Bc的范围,这对研究掺杂TMD中的量子相变很有意义。作者的工作有助于理解掺杂WSe2中增强的塞曼响应,促进了单层TMD在谷电子学中的应用。该文近期发表于npj Computational Materials 7, 198 (2021),英文标题与摘要如下,点击左下角“阅读原文”可以自由获取论文PDF。
Valley-filling instability and critical magnetic field for interaction-enhanced Zeeman response in doped WSe2monolayers
Fengyuan Xuan & Su Ying Quek
Carrier-doped transition metal dichalcogenide (TMD) monolayers are of great interest in valleytronics due to the large Zeeman response (g-factors) in these spin-valley-locked materials, arising from many-body interactions. We develop an ab initio approach based on many-body perturbation theory to compute the interaction-enhanced g-factors in carrier-doped materials. We show that the g-factors of doped WSe2 monolayers are enhanced by screened-exchange interactions resulting from magnetic-field-induced changes in band occupancies. Our interaction-enhanced g-factors g* agree well with experiment. Unlike traditional valleytronic materials such as silicon, the enhancement in g-factor vanishes beyond a critical magnetic field Bc achievable in standard laboratories. We identify ranges of g* for which this change in g-factor at Bc leads to a valley-filling instability and Landau level alignment, which is important for the study of quantum phase transitions in doped TMDs. We further demonstrate how to tune the g-factors and optimize the valley-polarization for the valley Hall effect.